"Performance Improvement for High Speed Devices Using E-tests and the SPICE ..."

Tae-Jin Kwon et al. (2001)

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DOI: 10.1109/ISQED.2001.915269

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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Tae-Jin Kwon, Sang-Hoon Lee, Tae-Seon Kim, Hoe-Jin Lee, Young-Kwan Park, Taek-Soo Kim, Seok-Jin Kim, Jeong-Taek Kong:
Performance Improvement for High Speed Devices Using E-tests and the SPICE Model. ISQED 2001: 443-447

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