"A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories."

Rei-Fu Huang et al. (2003)

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DOI: 10.1109/MTDT.2003.1222361

access: closed

type: Conference or Workshop Paper

metadata version: 2023-10-17

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  - https://dblp.org/rec/conf/mtdt/HuangDWL03
Rei-Fu Huang, Li-Ming Denq, Cheng-Wen Wu, Jin-Fu Li:
A Testability-Driven Optimizer and Wrapper Generator for Embedded Memories. MTDT 2003: 53-

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