"Noise and reliability in advanced CMOS devices for low power applications."

Purushothaman Srinivasan (2011)

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DOI: 10.1145/2020876.2020929

access: closed

type: Conference or Workshop Paper

metadata version: 2018-11-06

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Purushothaman Srinivasan:
Noise and reliability in advanced CMOS devices for low power applications. SBCCI 2011: 228

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