"On Test Generation for Microprocessors for Extended Class of Functional ..."

Adeboye Stephen Oyeniran et al. (2019)

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DOI: 10.1007/978-3-030-53273-4_2

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-27

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Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik:
On Test Generation for Microprocessors for Extended Class of Functional Faults. VLSI-SoC (Selected Papers) 2019: 21-44

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