"Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs."

Wen-Chieh Chen et al. (2023)

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DOI: 10.23919/VLSITECHNOLOGYANDCIR57934.2023.10185389

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-07

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Wen-Chieh Chen, S.-H. Chen, Anabela Veloso, Kateryna Serbulova, Geert Hellings, Guido Groeseneken:
Upcoming Challenges of ESD Reliability in DTCO with BS-PDN Routing via BPRs. VLSI Technology and Circuits 2023: 1-2

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