"A Genetic Algorithm-Based Metaheuristic Approach for Test Cost ..."

Tanusree Kaibartta et al. (2021)

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DOI: 10.1109/ACCESS.2021.3131336

access: open

type: Journal Article

metadata version: 2021-12-25

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Tanusree Kaibartta, G. P. Biswas, Arup Kumar Pal, Debesh Kumar Das:
A Genetic Algorithm-Based Metaheuristic Approach for Test Cost Optimization of 3D SIC. IEEE Access 9: 160987-161002 (2021)

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