"Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST."

Florence Azaïs et al. (2001)

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DOI: 10.1023/A:1012211328531

access: closed

type: Journal Article

metadata version: 2020-09-11

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Florence Azaïs, Serge Bernard, Yves Bertrand, Michel Renovell:
Optimizing Sinusoidal Histogram Test for Low Cost ADC BIST. J. Electron. Test. 17(3-4): 255-266 (2001)

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