"Unsupervised selective labeling for semi-supervised industrial defect ..."

Jian Ge et al. (2024)

> Home

Details and statistics

DOI: 10.1016/J.JKSUCI.2024.102179

access: open

type: Journal Article

metadata version: 2024-12-09

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/jksucis/GeQSJS24
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/jksucis/GeQSJS24
Jian Ge, Qin Qin, Shaojing Song, Jinhua Jiang, Zhiwei Shen:
Unsupervised selective labeling for semi-supervised industrial defect detection. J. King Saud Univ. Comput. Inf. Sci. 36(8): 102179 (2024)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.