"Enhancing confidence in indirect analog/RF testing against the lack of ..."

Haithem Ayari et al. (2014)

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DOI: 10.1016/J.MEJO.2013.12.006

access: closed

type: Journal Article

metadata version: 2020-02-22

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Haithem Ayari, Florence Azaïs, Serge Bernard, Mariane Comte, Vincent Kerzerho, Michel Renovell:
Enhancing confidence in indirect analog/RF testing against the lack of correlation between regular parameters and indirect measurements. Microelectron. J. 45(3): 336-344 (2014)

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