"Characterization of stress degradation effects and thermal properties of ..."

Arkadiusz Glowacki et al. (2009)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2009.07.022

access: closed

type: Journal Article

metadata version: 2020-02-22

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/GlowackiLBIBPLWT09
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/GlowackiLBIBPLWT09
Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle:
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectron. Reliab. 49(9-11): 1211-1215 (2009)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.