"High temperature electro-optical degradation of InGaN/GaN HBLEDs."

Matteo Meneghini et al. (2007)

> Home

Details and statistics

DOI: 10.1016/J.MICROREL.2007.07.081

access: closed

type: Journal Article

metadata version: 2024-05-07

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/mr/MeneghiniTSMVMZ07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/mr/MeneghiniTSMVMZ07
Matteo Meneghini, Lorenzo Trevisanello, C. Sanna, Giovanna Mura, Massimo Vanzi, Gaudenzio Meneghesso, Enrico Zanoni:
High temperature electro-optical degradation of InGaN/GaN HBLEDs. Microelectron. Reliab. 47(9-11): 1625-1629 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.