"Degradation study of single poly radiation sensors by monitoring charge ..."

Evgeny Pikhay, Yakov Roizin, Yael Nemirovsky (2016)

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DOI: 10.1016/J.MICROREL.2015.12.032

access: closed

type: Journal Article

metadata version: 2020-02-22

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Evgeny Pikhay, Yakov Roizin, Yael Nemirovsky:
Degradation study of single poly radiation sensors by monitoring charge trapping. Microelectron. Reliab. 59: 18-25 (2016)

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