"Reliability of power MOSFET-based smart switches under normal and extreme ..."

Gilles Rostaing et al. (2013)

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DOI: 10.1016/J.MICROREL.2013.07.120

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type: Journal Article

metadata version: 2021-10-14

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Gilles Rostaing, Mounira Berkani, D. Mechouche, Denis Labrousse, Stéphane Lefebvre, Zoubir Khatir, Philippe Dupuy:
Reliability of power MOSFET-based smart switches under normal and extreme conditions for 24 V battery system applications. Microelectron. Reliab. 53(9-11): 1703-1706 (2013)

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