"Advances in Electronic Testing: Challenges and Methodologies, Dimitris ..."

Mile K. Stojcev (2008)

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DOI: 10.1016/J.MICROREL.2006.09.015

access: closed

type: Journal Article

metadata version: 2020-02-22

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Mile K. Stojcev:
Advances in Electronic Testing: Challenges and Methodologies, Dimitris Gizopoulos (Ed.). Springer, Dordrecht (2006), 412 pp., plus XXVI, Hardcover, ISBN: 0-387-29408-2. Microelectron. Reliab. 48(5): 798-799 (2008)

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