"A Temperature-Aware Reliability Enhancement Strategy for 3-D Charge-Trap ..."

Yi Wang et al. (2019)

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DOI: 10.1109/TCAD.2018.2808227

access: closed

type: Journal Article

metadata version: 2021-09-15

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Yi Wang, Jiangfan Huang, Jing Yang, Tao Li:
A Temperature-Aware Reliability Enhancement Strategy for 3-D Charge-Trap Flash Memory. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 38(2): 234-244 (2019)

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