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export results for "CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability in Embedded Systems."

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@inproceedings{DBLP:conf/vlsid/SahooV018,
  author       = {Siva Satyendra Sahoo and
                  Bharadwaj Veeravalli and
                  Akash Kumar},
  title        = {CLRFrame: An Analysis Framework for Designing Cross-Layer Reliability
                  in Embedded Systems},
  booktitle    = {31st International Conference on {VLSI} Design and 17th International
                  Conference on Embedded Systems, {VLSID} 2018, Pune, India, January
                  6-10, 2018},
  pages        = {307--312},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/VLSID.2018.81},
  doi          = {10.1109/VLSID.2018.81},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/vlsid/SahooV018.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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