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ORCIDIEEE Design & Test of Computers, Volume 21
Volume 21, Number 1, January/February 2004
- Rajesh Gupta:
From the Editor in Chief: Predictability in Design and Manufacturing. 1-
- Dwight D. Hill, Andrew B. Kahng:
Guest Editors' Introduction: RTL to GDSII - From Foilware to Standard Practice. 9-12 - Louise Trevillyan, David S. Kung, Ruchir Puri, Lakshmi N. Reddy, Michael A. Kazda:
An Integrated Environment for Technology Closure of Deep-Submicron IC Designs. 14-22 - Jinan Lou, Wei Chen:
Crosstalk-Aware Placement. 24-32
- Bin-Hong Lin, Cheng-Wen Wu
, Hwei-Tsu Ann Luh:
Efficient and Economical Test Equipment Setup Using Procorrelation. 34-43 - Sule Ozev, Ismet Bayraktaroglu, Alex Orailoglu:
Seamless Test of Digital Components in Mixed-Signal Paths. 44-55 - Naran Sirisantana, Kaushik Roy:
Low-Power Design Using Multiple Channel Lengths and Oxide Thicknesses. 56-63
- Hans-Joachim Wunderlich, Sandeep K. Shukla:
Panel Summaries. IEEE Des. Test Comput. 21(1): 65-66 (2004) - Xiaowei Li:
Conference Reports. IEEE Des. Test Comput. 21(1): 68- (2004) - Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 21(1): 69- (2004)
- Test Technology TC Newsletter. IEEE Des. Test Comput. 21(1): 70-71 (2004)
- Scott Davidson:
Paperless Design and Test. IEEE Des. Test Comput. 21(1): 72- (2004)
Volume 21, Number 2, March/April 2004
- Rajesh Gupta:
From the EIC: Past successes, future challenges. 77-78
- Roy L. Russo:
Serving a growing community: How D&T began. 79 - Magdy S. Abadir, Li-C. Wang:
Guest Editors' Introduction: The Verification and Test of Complex Digital ICs. 80-82 - Allon Adir, Eli Almog, Laurent Fournier, Eitan Marcus, Michal Rimon, Michael Vinov, Avi Ziv:
Genesys-Pro: Innovations in Test Program Generation for Functional Processor Verification. 84-93 - Carl Scafidi, J. Douglas Gibson, Rohit Bhatia:
Validating the Itanium 2 Exception Control Unit: A Unit-Level Approach. 94-101 - Fulvio Corno, Ernesto Sánchez, Matteo Sonza Reorda, Giovanni Squillero:
Automatic Test Program Generation: A Case Study. 102-109 - Chia-Chih Yen, Jing-Yang Jou, Kuang-Chien Chen:
A Divide-and-Conquer-Based Algorithm for Automatic Simulation Vector Generation. 111-120 - Prabhat Mishra, Nikil D. Dutt, Narayanan Krishnamurthy, Magdy S. Abadir:
A Top-Down Methodology for Microprocessor Validation. 122-131 - Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang:
Safety Property Verification Using Sequential SAT and Bounded Model Checking. 132-143 - Rob Aitken, Stefan Eichenberger, Gary Maier, Sandip Kundu, Hank Walker:
ITC 2003 Roundtable: Design for Manufacturability. IEEE Des. Test Comput. 21(2): 144-156 (2004)
- Peter J. Ashenden:
Policies and procedures - who needs them? IEEE Des. Test Comput. 21(2): 157-158 (2004) - William Mann:
Southwest Test Workshop 2004. IEEE Des. Test Comput. 21(2): 159- (2004) - Carol Stolicny, Tapio Koivukangas, Rubin A. Parekhji, Ian G. Harris, Rob Aitken:
ITC 2003 panels: Part 1. IEEE Des. Test Comput. 21(2): 160-163 (2004) - Paolo Prinetto, Alfredo Benso:
Test Technology TC Newsletter. IEEE Des. Test Comput. 21(2): 164-165 (2004) - John Willis, Andreas Kuehlmann:
Design Automation TC Newsletter. IEEE Des. Test Comput. 21(2): 166- (2004)
- Prab Varma:
Verification evolution or industrial revolution? IEEE Des. Test Comput. 21(2): 168- (2004)
Volume 21, Number 3, May/June 2004
- Rajesh Gupta:
From the EIC: The next EDA challenge - Design for manufacturability. 169
- Vishwani D. Agrawal:
1985 to 1987: My years with D&T. 173-174
- Carol Stolicny, Mustapha Slamani, Fidel Muradali, Geir Eide, Mike Li:
ITC 2003 panels: Part 2. IEEE Des. Test Comput. 21(3): 175-176, 261-262 (2004)
- Yervant Zorian, Dimitris Gizopoulos, Cary Vandenberg, Philippe Magarshack:
Guest Editors' Introduction: Design for Yield and Reliability. 177-182 - Juan Antonio Carballo, Sani R. Nassif:
Impact of Design-Manufacturing Interface on SoC Design Methodologies. 183-191 - Alessandra Nardi, Alberto L. Sangiovanni-Vincentelli:
Logic Synthesis for Manufacturability. 192-199 - Samvel K. Shoukourian, Valery A. Vardanian, Yervant Zorian:
SoC Yield Optimization via an Embedded-Memory Test and Repair Infrastructure. 200-207 - Davide Appello, Alessandra Fudoli, Katia Giarda, Vincenzo Tancorre, Emil Gizdarski, Ben Mathew:
Understanding Yield Losses in Logic Circuits. 208-215 - Melvin A. Breuer, Sandeep K. Gupta, T. M. Mak:
Defect and Error Tolerance in the Presence of Massive Numbers of Defects. 216-227 - Subhasish Mitra, Wei-Je Huang, Nirmal R. Saxena, Shu-Yi Yu, Edward J. McCluskey:
Reconfigurable Architecture for Autonomous Self-Repair. 228-240 - T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang:
New Challenges in Delay Testing of Nanometer, Multigigahertz Designs. 241-247 - Bhaskar Chatterjee, Manoj Sachdev, Ali Keshavarzi:
DFT for Delay Fault Testing of High-Performance Digital Circuits. 248-258
- Luciano Lavagno:
DAC Highlights. IEEE Des. Test Comput. 21(3): 259-260 (2004)
- Design Automation Technical Committee Newsletter. IEEE Des. Test Comput. 21(3): 263- (2004)
- Hans A. R. Manhaeve:
Current testing for nanotechnologies: Myths, facts, and figures. IEEE Des. Test Comput. 21(3): 264- (2004)
Volume 21, Number 4, July/August 2004
- Rajesh Gupta:
From the EIC: Manufacturing test woes. 269-270
- Sumit DasGupta:
Looking back, looking around. IEEE Des. Test Comput. 21(4): 271-273 (2004) - André Ivanov, Fabrizio Lombardi, Cecilia Metra:
Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. 274-276 - T. M. Mak, Mike Tripp, Anne Meixner:
Testing Gbps Interfaces without a Gigahertz Tester. 278-286 - David C. Keezer, Dany Minier, Marie-Christine Caron:
Multiplexing ATE Channels for Production Testing at 2.5 Gbps. 288-301 - Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov:
Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. 302-313 - Stephen K. Sunter, Aubin Roy:
On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz. 314-321
- Ming-Jun Hsiao, Jing-Reng Huang, Tsin-Yuan Chang:
A Built-In Parametric Timing Measurement Unit. 322-330 - Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian:
Design & Test Education in Asia. IEEE Des. Test Comput. 21(4): 331-338 (2004)
- Conference Reports. IEEE Des. Test Comput. 21(4): 339-341 (2004)
- Panel Summaries. IEEE Des. Test Comput. 21(4): 342- (2004)
- John Willis, Joe Damore:
Design automation Technical Committee Newsletter. IEEE Des. Test Comput. 21(4): 343- (2004) - Rob Aitken:
Test at Gbps: Megaproblem or micromanagement? IEEE Des. Test Comput. 21(4): 344- (2004)
Volume 21, Number 5, September/October 2004
- Rajesh Gupta:
Silicon for embedded multimedia processing. 345
- Conference Reports. 350-353
- Radu Marculescu, Petru Eles:
Guest Editors' Introduction: Designing Real-Time Embedded Multimedia Systems. 354-356 - Chaeseok Im, Soonhoi Ha:
Energy Optimization for Latency- and Quality-Constrained Video Applications. 358-366 - Alexander Maxiaguine, Samarjit Chakraborty, Simon Künzli, Lothar Thiele:
Evaluating Schedulers for Multimedia Processing on Buffer-Constrained SoC Platforms. 368-377 - Paul Marchal, Francky Catthoor, Davide Bruni, Luca Benini, José Ignacio Gómez, Luis Piñuel:
Integrated Task Scheduling and Data Assignment for SDRAMs in Dynamic Applications. 378-387 - Hojun Shim, Naehyuck Chang, Massoud Pedram:
A Backlight Power Management Framework for Battery-Operated Multimedia Systems. 388-396 - Sudeep Pasricha, Manev Luthra, Shivajit Mohapatra, Nikil D. Dutt, Nalini Venkatasubramanian:
Dynamic Backlight Adaptation for Low-Power Handheld Devices. 398-405 - Haris Lekatsas, Jörg Henkel, Srimat T. Chakradhar, Venkata Jakkula:
Cypress: Compression and Encryption of Data and Code for Embedded Multimedia Systems. 406-415
- Maria Varsamou, Nikolaos Papandreou, Theodore Antonakopoulos:
From Protocol Models to Their Implementation: A Versatile Testing Methodology. 416-428 - Ad J. van de Goor:
An Industrial Evaluation of DRAM Tests. 430-440 - Engineering Applied to Societal Problems: A New Outlook. 441-446
- Scott Davidson:
A practical look at ATPG. 448-449 - Erich Marschner, Victor Berman:
The continuing evolution of EDA standards. 450-451 - DATC Newsletter. 455
- Scott Davidson:
Open-source hardware. 456-
Volume 21, Number 6, November-December 2004
- Rajesh K. Gupta:
Verification synergies. 457
- Carl Pixley, Sharad Malik:
Guest Editors' Introduction: Exploring Synergies for Design Verification. 461-463 - Martin Zambaldi, Wolfgang Ecker, Renate Henftling, Matthias Bauer:
A Layered Adaptive Verification Platform for Simulation, Test, and Emulation. 464-471 - Serdar Tasiran, Yuan Yu, Brannon Batson:
Linking Simulation with Formal Verification at a Higher Level. 472-482 - Young-Il Kim, Chong-Min Kyung:
TPartition: Testbench Partitioning for Hardware-Accelerated Functional Verification. 484-493 - Jayanta Bhadra, Narayanan Krishnamurthy, Magdy S. Abadir:
Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation. 494-502
- Shuo Sheng, Michael S. Hsiao:
Success-Driven Learning in ATPG for Preimage Computation. 504-512 - Ioannis Papaefstathiou:
Titan II: An IPcomp Processor for 10-Gbps Networks. 514-523 - Frederic Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli:
On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations. 524-535 - Marcel A. Kossel, Martin L. Schmatz:
Jitter Measurements of High-Speed Serial Links. 536-543 - Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren:
A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. 544-551 - Fernanda Lima Kastensmidt, Gustavo Neuberger, Renato Fernandes Hentschke, Luigi Carro, Ricardo Reis:
Designing Fault-Tolerant Techniques for SRAM-Based FPGAs. 552-562 - Naran Sirisantana, Bipul Chandra Paul, Kaushik Roy:
Enhancing Yield at the End of the Technology Roadmap. 563-571 - Ikhwan Lee, Yongseok Choi, Youngjin Cho, Yongsoo Joo, Hyeonmin Lim, Hyung Gyu Lee, Hojun Shim, Naehyuck Chang:
Web-Based Energy Exploration Tool for Embedded Systems. 572-586
- Book Reviews. 590-591
- Victor Berman:
System-level design language standard needed. 592-593 - Vladimir Hahanov, Raimund Ubar, Subhasish Mitra:
Conference Reports. 594-595 - DATC Newsletter. 596
- Scott Davidson:
Design illiteracy. 608
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