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ORCIDRandall L. Geiger
Randy Geiger
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- affiliation: Iowa State University, Ames, Iowa, USA
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2020 – today
- 2024
[c126]Kwabena Oppong Banahene, Randall L. Geiger:
Compact Temperature Sensor with Voltage-Ratio Current-Independent Output for Reference Independent Data Conversion. ISCAS 2024: 1-5- [c125]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
Novel Single-Temperature Trim Techniques for Bandgap Voltage References. MWSCAS 2024: 683-687 - [c124]Emmanuel Amankrah, Bryce Gadogbe, Patricia Tutuani, Randall L. Geiger:
A 0.5V, 5.7ppm/°C Voltage Reference with Subthreshold MOSFET and Piecewise Compensation. MWSCAS 2024: 960-964 - [c123]Patricia Tutuani, Emmanuel Amankrah, Randall L. Geiger:
A 4ps Resolution Capacitive-Tuned Delay Pulse Shrinking Time to Digital Converter. MWSCAS 2024: 1091-1095 - 2023
- [c122]Daniel Adjei, Bryce Gadogbe
, Degang Chen, Randall L. Geiger:
A Resistorless Precision Curvature-Compensated Bandgap Voltage Reference Based on the VGO Extraction Technique. ISCAS 2023: 1-5 - [c121]Bryce Gadogbe, Daniel Adjei, Kwabena Oppong Banahene, Randall L. Geiger, Degang Chen:
Sub-ppm/°C High Performance Voltage Reference. ISCAS 2023: 1-4 - [c120]Daniel Adjei, Bryce Gadogbe, Degang Chen, Randall L. Geiger, Shravan K. Chaganti, Dhyey Desai, Jerry Doorenbos, Jim Todsen:
An Improved Single-Temperature Trim Technique for 1st Order-Compensated Bandgap References. MWSCAS 2023: 59-63 - [c119]Bryce Gadogbe, Ruohang Yang, Kwabena Oppong Banahene, Pallavi Ebenezer, Randall L. Geiger, Degang Chen:
Very Compact Temperature Sensor for Power/Thermal Management. MWSCAS 2023: 142-146 - [c118]Ruohan Yang, Bryce Gadogbe, Randall L. Geiger, Degang Chen:
A Compact and Accurate MOS-based Temperature Sensor for Thermal Management. MWSCAS 2023: 594-598 - [c117]Bryce Gadogbe, Randall L. Geiger:
A 15μW Low Cost CMOS Smart Temperature Sensor. MWSCAS 2023: 599-603 - 2022
- [c116]Kwabena Oppong Banahene, Matthew R. Strong, Bryce Gadogbe, Degang Chen, Randall L. Geiger:
Hardware Security Vulnerability in Analog Signal Chain Filters. ISCAS 2022: 667-671 - 2021
- [j20]Nanqi Liu, Randall L. Geiger, Degang Chen:
Sub-ppm/°C Bandgap References With Natural Basis Expansion for Curvature Cancellation. IEEE Trans. Circuits Syst. I Regul. Pap. 68(9): 3551-3561 (2021) - 2020
- [j19]Chulhyun Park, Tao Chen, Kyoohyun Noh, Dadian Zhou, Suraj Prakash, Mohammadhossein Naderi Alizadeh, Aydin I. Karsilayan, Degang Chen, Randall L. Geiger, José Silva-Martínez:
A 12-Bit 125-MS/s 2.5-Bit/Cycle SAR-Based Pipeline ADC Employing a Self-Biased Gain Boosting Amplifier. IEEE Trans. Circuits Syst. 67-I(11): 3618-3629 (2020) - [j18]Tao Chen, Chulhyun Park, Shravan K. Chaganti, José Silva-Martínez, Randall L. Geiger, Degang Chen:
An Ultrafast Multibit/Stage Pipelined ADC Testing and Calibration Method. IEEE Trans. Instrum. Meas. 69(3): 729-738 (2020) - [j17]Tao Chen, Chulhyun Park, Hao Meng, Dadian Zhou, José Silva-Martínez, Randall L. Geiger, Degang Chen:
A Low-Cost On-Chip Built-In Self-Test Solution for ADC Linearity Test. IEEE Trans. Instrum. Meas. 69(6): 3516-3526 (2020) - [c115]Pallavi Sugantha Ebenezer, Vijayalakshmi Naganadhan, Degang Chen, Randall L. Geiger:
Three-Junction Bandgap Circuit with Sub 1 ppm/°C Temperature Coefficient. MWSCAS 2020: 305-308
2010 – 2019
- 2019
- [c114]Nanqi Liu, Randy Geiger, Degang Chen:
Bandgap Voltage VGO Extraction with Two-Temperature Trimming for Designing Sub-ppm/°C Voltage References. ISCAS 2019: 1-4 - [c113]Tyler Archer, Pallavi Ebenezer, Chin-Wen Chen, Randall L. Geiger:
Nonlinear Device Conversion. MWSCAS 2019: 359-364 - [c112]Pallavi Ebenezer, Tyler Archer, Degang Chen, Randall L. Geiger:
A Precision Bandgap Voltage Reference Using Curvature Elimination Technique. MWSCAS 2019: 505-508 - [e1]Hoi Lee, Randall L. Geiger:
62nd IEEE International Midwest Symposium on Circuits and Systems, MWSCAS 2019, Dallas, TX, USA, August 4-7, 2019. IEEE 2019, ISBN 978-1-7281-2788-0 [contents] - 2018
- [j16]Tao Chen, Xiankun Jin, Randall L. Geiger, Degang Chen:
USER-SMILE: Ultrafast Stimulus Error Removal and Segmented Model Identification of Linearity Errors for ADC Built-in Self-Test. IEEE Trans. Circuits Syst. I Regul. Pap. 65-I(7): 2059-2069 (2018) - [c111]Hao Meng, Randall L. Geiger, Degang Chen:
A High Constancy Rail-to-rail Level Shift Generator for SEIR-based BIST circuit for ADCs. ISCAS 2018: 1-5 - [c110]Qianqian Wang, Degang Chen, Randall L. Geiger:
Transparent side channel trigger mechanism on analog circuits with PAAST hardware Trojans. ISCAS 2018: 1-4 - 2017
- [c109]Xiankun Jin, Tao Chen, Mayank Jain, Arun Kumar Barman, David Kramer, Doug Garrity, Randall L. Geiger, Degang Chen:
An on-chip ADC BIST solution and the BIST enabled calibration scheme. ITC 2017: 1-10 - [c108]Qianqian Wang, Degang Chen, Randall L. Geiger:
Technique for generating timing skew resistant time-interleaved signals. MWSCAS 2017: 1561-1564 - 2015
- [c107]Yen-Ting Wang, Chen Zhao, Degang Chen, Randall L. Geiger:
Direct temperature to digital converters with low supply sensitivity for power/thermal management. ISCAS 2015: 1066-1069 - [c106]Qianqian Wang, Randall L. Geiger, Degang Chen:
A programmable temperature trigger circuit. ISCAS 2015: 1070-1073 - [c105]Xu Zhang, Chongli Cai, Hao Meng, Siva Sudani, Randall L. Geiger, Degang Chen:
A calibration technique for SAR analog-to-digital converter based on INL testing with quantization bits and redundant bit. ISCAS 2015: 3024-3027 - [c104]Xing Cao, Qianqian Wang, Randall L. Geiger, Degang Chen:
A hardware Trojan embedded in the Inverse Widlar reference generator. MWSCAS 2015: 1-4 - 2014
- [c103]Zhiqiang Liu, You Li, Yan Duan, Randall L. Geiger, Degang Chen:
Identification and break of positive feedback loops in Trojan States Vulnerable Circuits. ISCAS 2014: 289-292 - [c102]José Silva-Martínez, Edgar Sánchez-Sinencio, José G. Delgado-Frias, Randall L. Geiger:
Welcome to MWSCAS 2014. MWSCAS 2014: 1-2 - [c101]Srijita Patra, Randall L. Geiger:
Comparison of MOSFET mismatch models with random physical and random model variables. MWSCAS 2014: 278-281 - [c100]Qianqian Wang, Randall L. Geiger, Degang Chen:
Challenges and opportunities for determining presence of multiple equilibrium points with circuit simulators. MWSCAS 2014: 406-409 - [c99]Rui Bai, Randall L. Geiger:
Effects of non-ideal characteristics of substrate BJT on bandgap reference circuits. MWSCAS 2014: 471-474 - [c98]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
A CMOS supply-insensitive with 13ppm/°C temperature coefficient current reference. MWSCAS 2014: 475-478 - [c97]Zhiqiang Liu, You Li, Randall L. Geiger, Degang Chen:
Auto-identification of positive feedback loops in multi-state vulnerable circuits. VTS 2014: 1-5 - 2013
- [j15]Bharath Karthik Vasan, Siva Kumar Sudani, Degang Chen, Randall L. Geiger:
Low-Distortion Sine Wave Generation Using a Novel Harmonic Cancellation Technique. IEEE Trans. Circuits Syst. I Regul. Pap. 60-I(5): 1122-1134 (2013) - [c96]Srijita Patra, Degang Chen, Randy Geiger:
Reliability degradation with electrical, thermal and thermal gradient stress in interconnects. ISCAS 2013: 1063-1066 - [c95]Chen Zhao, Yen-Ting Wang, David Genzer, Degang Chen, Randall L. Geiger:
A CMOS on-chip temperature sensor with -0.21°C 0.17 °C inaccuracy from -20 °C to 100 °C. ISCAS 2013: 2621-2625 - [c94]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Practical methods for verifying removal of Trojan stable operating points. ISCAS 2013: 2658-2661 - [c93]Siva Sudani, Degang Chen, Randall L. Geiger:
High resolution ADC spectral test with known impure source and non-coherent sampling. ISCAS 2013: 2674-2677 - [c92]Chin-Wen Chen, Randall L. Geiger, Shu-Chuan Huang:
A low-power supply-insensitive temperature sensor in 90nm CMOS process. MWSCAS 2013: 979-982 - [c91]Yen-Ting Wang, Degang Chen, Randall L. Geiger:
Effectiveness of circuit-level continuation methods for Trojan State Elimination verification. MWSCAS 2013: 1043-1046 - 2012
- [j14]Jingbo Duan, Bharath K. Vasan, Chen Zhao, Degang Chen, Randall L. Geiger:
On Chip Signal Generators for Low Overhead ADC BIST. J. Electron. Test. 28(5): 615-623 (2012) - [c90]Jingbo Duan, Degang Chen, Randall L. Geiger:
A low cost method for testing offset and gain error for ADC BIST. ISCAS 2012: 2023-2026 - [c89]Bharath K. Vasan, Siva Sudani, Degang Chen, Randall L. Geiger:
Sinusoidal signal generation for production testing and BIST applications. ISCAS 2012: 2601-2604 - [c88]Chen Zhao, Randall L. Geiger, Degang Chen:
A compact low-power supply-insensitive CMOS current reference. ISCAS 2012: 2825-2828 - [c87]Siva Sudani, Degang Chen, Randy Geiger:
A method for accurate full spectrum testing without requiring coherency. MWSCAS 2012: 346-349 - [c86]Srijita Patra, Degang Chen, Randy Geiger:
Reliability modeling of metal interconnects with time-dependent electrical and thermal stress. MWSCAS 2012: 514-517 - [c85]Yen-Ting Wang, Chen Zhao, Randall L. Geiger, Degang Chen, Shu-Chuan Huang:
Performance verification of start-up circuits in reference generators. MWSCAS 2012: 518-521 - 2011
- [c84]Chen Zhao, Jun He, Sheng-Huang Lee, Karl Peterson, Randall L. Geiger, Degang Chen:
Linear vt-based temperature sensors with low process sensitivity and improved power supply headroom. ISCAS 2011: 2553-2556 - 2010
- [c83]Jingbo Duan, Degang Chen, Randall L. Geiger:
Phase control of triangular stimulus generator for ADC BIST. ISCAS 2010: 1935-1938 - [c82]Jun He, Degang Chen, Randall L. Geiger:
Detailed analyses in prediction of capacitive-mismatch-induced offset in dynamic comparators. ISCAS 2010: 2390-2393 - [c81]Bharath K. Vasan, Randall L. Geiger, Degang Chen:
Linearity testing of ADCs using low linearity stimulus and Kalman filtering. ISCAS 2010: 3032-3035
2000 – 2009
- 2009
- [j13]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
Analyses of Static and Dynamic Random Offset Voltages in Dynamic Comparators. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(5): 911-919 (2009) - [j12]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. IEEE Trans. Instrum. Meas. 58(8): 2679-2685 (2009) - [j11]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
High-Resolution ADC Linearity Testing Using a Fully Digital-Compatible BIST Strategy. IEEE Trans. Instrum. Meas. 58(8): 2697-2705 (2009) - [c80]Bharath K. Vasan, Jingbo Duan, Chen Zhao, Randall L. Geiger, Degang Chen:
Signal generators for cost effective BIST of ADCs. ECCTD 2009: 113-116 - [c79]Jingbo Duan, Degang Chen, Randall L. Geiger:
Cost Effective Signal Generators for ADC BIST. ISCAS 2009: 13-16 - [c78]Thu T. Duong, Degang Chen, Randall L. Geiger:
Optimal Area and Impedance Allocation for Dual-string DACs. ISCAS 2009: 2741-2744 - 2008
- [j10]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DAC Using Low-Resolution ADC With Wobbling. IEEE Trans. Instrum. Meas. 57(5): 940-946 (2008) - [c77]Hanqing Xing, Degang Chen, Randall L. Geiger:
On-chip at-speed linearity testing of high-resolution high-speed DACs using DDEM ADCs with dithering. EIT 2008: 117-122 - [c76]Jacob D. Sloat, Randall L. Geiger:
An inexpensive microelectronic environmental test chamber. EIT 2008: 168-170 - [c75]Jun He, Sanyi Zhan, Degang Chen, Randall L. Geiger:
A simple and accurate method to predict offset voltage in dynamic comparators. ISCAS 2008: 1934-1937 - [c74]Vipul Katyal, Randall L. Geiger, Degang Chen:
Adjustable hysteresis CMOS Schmitt triggers. ISCAS 2008: 1938-1941 - [c73]Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin:
System identification -based reduced-code testing for pipeline ADCs' linearity test. ISCAS 2008: 2402-2405 - 2007
- [j9]Chengming He, Le Jin, Degang Chen, Randy Geiger:
Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques. IEEE Trans. Circuits Syst. I Regul. Pap. 54-I(5): 964-973 (2007) - [j8]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High-Resolution ADCs With Low-Resolution/Accuracy Deterministic Dynamic Element Matched DACs. IEEE Trans. Instrum. Meas. 56(5): 1753-1762 (2007) - [j7]Le Jin, Degang Chen, Randall L. Geiger:
SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving. IEEE Trans. Instrum. Meas. 56(5): 1776-1785 (2007) - [c72]Haibo Fei, Randall L. Geiger:
Linear Current Division Principles. ISCAS 2007: 2830-2833 - [c71]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Deterministic DEM DAC Performance Analysis. ISCAS 2007: 3860-3863 - [c70]Hanqing Xing, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A fully digital-compatible BIST strategy for ADC linearity testing. ITC 2007: 1-10 - [c69]Le Jin, Degang Chen, Randall L. Geiger:
Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal. VTS 2007: 303-310 - 2006
- [j6]Yu Lin, Degang Chen, Randall L. Geiger:
Yield enhancement with optimal area allocation for ratio-critical analog circuits. IEEE Trans. Circuits Syst. I Regul. Pap. 53-I(3): 534-553 (2006) - [j5]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach for testing high-resolution ADCs with low-accuracy excitations. IEEE Trans. Instrum. Meas. 55(3): 902-915 (2006) - [c68]Vipul Katyal, Randall L. Geiger, Degang Chen:
A New High Precision Low Offset Dynamic Comparator for High Resolution High Speed ADCs. APCCAS 2006: 5-8 - [c67]Xin Dai, Degang Chen, Randall L. Geiger:
Explicit characterization of bandgap references. ISCAS 2006 - [c66]Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger:
A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient. ISCAS 2006 - [c65]Yu Lin, Randall L. Geiger:
Unit resistor characterization for matching-critical circuit design. ISCAS 2006 - [c64]Chao Su, Randall L. Geiger:
Dynamic calibration of current-steering DAC. ISCAS 2006 - [c63]Kazuyuki Wada, Randall L. Geiger:
Minimization of total area in integrated active RC filters. ISCAS 2006 - [c62]Hanqing Xing, Degang Chen, Randall L. Geiger:
Linearity test for high resolution DACs using low-accuracy DDEM flash ADCs. ISCAS 2006 - [c61]Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger:
Characterization of a current-mode bandgap circuit structure for high-precision reference applications. ISCAS 2006 - [c60]Le Jin, Degang Chen, Randall L. Geiger:
Linearity Test of Analog-to-Digital Converters Using Kalman Filtering. ITC 2006: 1-9 - [c59]Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen:
Testing of Precision DACs Using Low-Resolution ADCs with Dithering. ITC 2006: 1-10 - 2005
- [j4]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal. IEEE Trans. Instrum. Meas. 54(3): 1188-1199 (2005) - [c58]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
A segmented thermometer coded DAC with deterministic dynamic element matching for high resolution ADC test. ISCAS (1) 2005: 784-787 - [c57]Zhongjun Yu, Degang Chen, Randall L. Geiger, Ioannis Papantonopoulos:
Pipeline ADC linearity testing with dramatically reduced data capture time. ISCAS (1) 2005: 792-795 - [c56]Le Jin, Degang Chen, Randall L. Geiger:
A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals. ISCAS (2) 2005: 1378-1381 - [c55]Yu Lin, Vipul Katyal, Randall L. Geiger:
Power dependence of feedback amplifiers on opamp architecture. ISCAS (2) 2005: 1618-1621 - [c54]Yu Lin, Vipul Katyal, Mark Schlarmann, Randall L. Geiger:
kT/C constrained optimization of power in pipeline ADCs. ISCAS (3) 2005: 1968-1971 - [c53]Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen:
A test strategy for time-to-digital converters using dynamic element matching and dithering. ISCAS (4) 2005: 3809-3812 - [c52]Hanjun Jiang, Degang Chen, Randall L. Geiger:
Dither incorporated deterministic dynamic element matching for high resolution ADC test using extremely low resolution DACs. ISCAS (5) 2005: 4285-4288 - [c51]Hanqing Xing, Degang Chen, Randall L. Geiger:
A two-step DDEM ADC for accurate and cost-effective DAC testing. ISCAS (5) 2005: 4289-4292 - [c50]Xin Dai, Degang Chen, Randall L. Geiger:
A cost-effective histogram test-based algorithm for digital calibration of high-precision pipelined ADCs. ISCAS (5) 2005: 4831-4834 - [c49]Xin Dai, Chengming He, Hanqing Xing, Degang Chen, Randall L. Geiger:
An Nth order central symmetrical layout pattern for nonlinear gradients cancellation. ISCAS (5) 2005: 4835-4838 - [c48]Sreenath Thoka, Randall L. Geiger:
Fast-switching adaptive bandwidth frequency synthesizer using a loop filter with switched zero-resistor array. ISCAS (6) 2005: 5373-5376 - [c47]Degang Chen, Zhongjun Yu, Randall L. Geiger:
An adaptive, truly background calibration method for high speed pipeline ADC design. ISCAS (6) 2005: 6190-6193 - [c46]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen:
High-performance ADC linearity test using low-precision signals in non-stationary environments. ITC 2005: 10 - [c45]Kumar L. Parthasarathy, Turker Kuyel, Zhongjun Yu, Degang Chen, Randall L. Geiger:
A 16-bit resistor string DAC with full-calibration at final test. ITC 2005: 10 - 2004
- [c44]Hanjun Jiang, Haibo Fei, Degang Chen, Randall L. Geiger:
A background digital self-calibration scheme for pipelined ADCs based on transfer curve estimation. ISCAS (1) 2004: 61-64 - [c43]Chengming He, Kuangming Yap, Degang Chen, Randall L. Geiger:
NTH order circular symmetry pattern and hexagonal tesselation: two new layout techniques cancelling nonlinear gradient. ISCAS (1) 2004: 237-240 - [c42]Zhongjun Yu, Degang Chen, Randall L. Geiger:
The SRE/SRM approach for spectral testing of AMS circuits. ISCAS (1) 2004: 249-252 - [c41]Chengming He, Le Jin, Degang Chen, Randall L. Geiger:
Robust design of high gain amplifiers using dynamical systems and bifurcation theory. ISCAS (1) 2004: 481-484 - [c40]Zhongjun Yu, Degang Chen, Randall L. Geiger:
Accurate testing of ADC's spectral performance using imprecise sinusoidal excitations. ISCAS (1) 2004: 645-648 - [c39]Haibo Fei, Randall L. Geiger, Degang Chen:
Optimum area allocation for resistors and capacitors in continuous-time monolithic filters. ISCAS (1) 2004: 865-868 - [c38]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Testing high resolution ADCs using deterministic dynamic element matching. ISCAS (1) 2004: 920-923 - [c37]Beatriz Olleta, Hanjun Jiang, Degang Chen, Randall L. Geiger:
Parameter optimization of deterministic dynamic element matching DACs for accurate and cost-effective ADC testing. ISCAS (1) 2004: 924-927 - [c36]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli. ISCAS (1) 2004: 928-931 - [c35]Le Jin, Chengming He, Degang Chen, Randall L. Geiger:
Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals. ISCAS (1) 2004: 932-935 - [c34]Hanjun Jiang, Beatriz Olleta, Degang Chen, Randall L. Geiger:
Testing High Resolution ADCs with Low Resolution/Accuracy Deterministic Dynamic Element Matched DACs. ITC 2004: 1379-1388 - [c33]Zhongjun Yu, Degang Chen, Randall L. Geiger:
A Computationally Efficient Method for Accurate Spectral Testing without Requiring Coherent Sampling. ITC 2004: 1398-1407 - 2003
- [j3]Yonghua Cong, Randall L. Geiger:
A 1.5-V 14-bit 100-MS/s self-calibrated DAC. IEEE J. Solid State Circuits 38(12): 2051-2060 (2003) - [j2]Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger:
BIST and production testing of ADCs using imprecise stimulus. ACM Trans. Design Autom. Electr. Syst. 8(4): 522-545 (2003) - [c32]Mezyad M. Amourah, Haydar Bilhan, Feng Ying, Lieyi Fang, Gonggui Xu, Ramesh Chandrasekarad, Randall L. Geiger:
A 9b 165MS/s 1.8V pipelined ADC with all digital transistors amplifier. CICC 2003: 421-424 - [c31]Yonghui Tang, Randall L. Geiger:
High-frequency 750mV operational amplifier standard bulk CMOS process. CICC 2003: 689-692 - [c30]Chengming He, Degang Chen, Randall L. Geiger:
A low-voltage compatible two-stage amplifier with ≥120 dB gain in standard digital CMOS. ISCAS (1) 2003: 353-356 - [c29]Beatriz Olleta, Lance Juffer, Degang Chen, Randall L. Geiger:
A deterministic dynamic element matching approach to ADC testing. ISCAS (5) 2003: 533-536 - [c28]Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger:
Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance. ISCAS (5) 2003: 537-540 - [c27]Kee-Chee Tiew, J. Cusey, Randall L. Geiger:
Inflection point correction for voltage references. ISCAS (1) 2003: 649-652 - [c26]Chao Su, Sreenath Thoka, Kee-Chee Tiew, Randall L. Geiger:
A 40 GHz modified-Colpitts voltage controlled oscillator with increased tuning range. ISCAS (1) 2003: 717-720 - [c25]Zhongjun Yu, Degang Chen, Randall L. Geiger:
1-D and 2-D switching strategies achieving near optimal INL for thermometer-coded current steering DACs. ISCAS (1) 2003: 909-912 - [c24]Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger:
Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs. ITC 2003: 218-227 - 2002
- [c23]Jie Yan, Randall L. Geiger:
A high gain CMOS operational amplifier with negative conductance gain enhancement. CICC 2002: 337-340 - [c22]Yu Lin, Randall L. Geiger:
Resistors layout for enhancing yield of R-2R DACs. ISCAS (5) 2002: 97-100 - [c21]Yonghua Cong, Randall L. Geiger:
Formulation of INL and DNL yield estimation in current-steering D/A converters. ISCAS (3) 2002: 149-152 - [c20]Yonghui Tang, Randall L. Geiger:
Transient bit error rate analysis of data recovery systems using jitter models. ISCAS (3) 2002: 185-188 - [c19]Kee-Chee Tiew, J. Cusey, Randall L. Geiger:
A curvature compensation technique for bandgap voltage references using adaptive reference temperature. ISCAS (4) 2002: 265-268 - [c18]Mezyad M. Amourah, Randall L. Geiger:
All digital transistor high gain operational amplifier using positive feedback technique. ISCAS (1) 2002: 701-704 - 2001
- [c17]Mao-Feng Lan, Randall L. Geiger:
Modeling of random channel parameter variations in MOS transistors. ISCAS (1) 2001: 85-88 - [c16]Mao-Feng Lan, Randall L. Geiger:
MOSGRAD-a tool for simulating the effects of systematic and random channel parameter variations. ISCAS (1) 2001: 89-92 - [c15]Mark Schlarmann, Randall L. Geiger:
Prototype implementation of a WWW based analog circuit design tool. ISCAS (1) 2001: 97-100 - [c14]Jie Yan, Randall L. Geiger:
Fast-settling CMOS operational amplifiers with negative conductance voltage gain enhancement. ISCAS (1) 2001: 228-231 - [c13]Mezyad M. Amourah, Randall L. Geiger:
Gain and bandwidth boosting techniques for high-speed operational amplifiers. ISCAS (1) 2001: 232-235 - [c12]Yonghui Tang, Randall L. Geiger:
A 2.5 Gbit/s CMOS PLL for data/clock recovery without frequency divider. ISCAS (1) 2001: 256-259 - [c11]Huiting Chen, Frank Whiteside, Randall L. Geiger:
Current mirror circuit with accurate mirror gain for low beta transistors. ISCAS (1) 2001: 536-539 - [c10]Mezyad M. Amourah, Randall L. Geiger:
A high gain strategy with positive-feedback gain enhancement technique. ISCAS (1) 2001: 631-634 - 2000
- [c9]Mao-Feng Lan, Randall L. Geiger:
Gradient sensitivity reduction in current mirrors with non-rectangular layout structures. ISCAS 2000: 687-690
1990 – 1999
- 1999
- [c8]S. Nagavarapu, J. Yan, Edward K. F. Lee, Randall L. Geiger:
An asynchronous data recovery/retransmission technique with foreground DLL calibration. ISCAS (6) 1999: 354-357 - [c7]L. Wu, Huiting Chen, S. Nagavarapu, Randall L. Geiger, Edward Lee, W. Black:
A monolithic 1.25 Gbits/sec CMOS clock/data recovery circuit for fibre channel transceiver. ISCAS (2) 1999: 565-568 - [c6]Huiting Chen, Edward Lee, Randall L. Geiger:
A 2 GHz VCO with process and temperature compensation. ISCAS (2) 1999: 569-572 - [c5]Mark Schlarmann, Edward K. F. Lee, Randall L. Geiger:
A new multipath amplifier design technique for enhancing gain without sacrificing bandwidth. ISCAS (2) 1999: 610-615 - 1994
- [j1]Chong-Gun Yu, Randall L. Geiger:
An automatic offset compensation scheme with ping-pong control for CMOS operational amplifiers. IEEE J. Solid State Circuits 29(5): 601-610 (1994) - [c4]Chong-Gun Yu, Randall L. Geiger:
An Accurate and Matching-Free Threshold Voltage Extraction Scheme for MOS Transistors. ISCAS 1994: 115-118 - [c3]Joon-Yub Kim, Randall L. Geiger:
MOS Active Attenuators for Analog ICs and their Applications to FInite Gain Amplifiers. ISCAS 1994: 701-704 - 1993
- [c2]George R. Spalding, Randall L. Geiger:
Digital correction for improved spectral response in signal generation systems. ISCAS 1993: 132-135 - [c1]Chong-Gun Yu, Randall L. Geiger:
Very Low Voltage Operational Amplifiers Using Floating Gate MOS Transistor. ISCAS 1993: 1152-1155
Coauthor Index
[c125] [c122] [c121] [c120] [c119] [c118] [c116] [j20] [j19] [j18] [j17] [c115] [c114] [c112] [j16] [c111] [c110] [c109] [c108] [c107] [c106] [c105] [c104] [c103] [c100] [c98] [c97] [j15] [c96] [c95] [c94] [c93] [c91] [j14] [c90] [c89] [c88] [c87] [c86] [c85] [c84] [c83] [c82] [c81] [j13] [j12] [j11] [c80] [c79] [c78] [j10] [c77] [c75] [c74] [c73] [j9] [j8] [j7] [c71] [c70] [c69] [j6] [j5] [c68] [c67] [c66] [c62] [c61] [c60] [c59] [j4] [c58] [c57] [c56] [c53] [c52] [c51] [c50] [c49] [c47] [c46] [c45] [c44] [c43] [c42] [c41] [c40] [c39] [c38] [c37] [c36] [c35] [c34] [c33] [j2] [c30] [c29] [c28] [c25] [c24]
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