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ORCIDGildas Léger
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2020 – today
- 2023
[j13]Carlos Manuel Domínguez-Matas
, Antonio J. Ginés, Aránzazu Otín, Valentin Gutierrez, Gildas Léger, Eduardo J. Peralías:
Behavioral Model for High-Speed SAR ADCs With On-Chip References. IEEE Trans. Very Large Scale Integr. Syst. 31(12): 1918-1930 (2023)- [c35]Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Valentin Gutierrez, C. Dominguez, Maria Angeles Jalón, L. Carranza:
A Single-Event Latchup setup for high-precision AMS circuits. ETS 2023: 1-6 - 2022
- [j12]Hala Youssef Darweesh, Càndid Reig, Gildas Léger:
Self-Healing of Redundant FLASH ADCs. IEEE Des. Test 39(3): 125-133 (2022) - [c34]William R. Eisenstadt, Mark Roos, Devin Morris, José Luis González-Jiménez, Christopery Mounet, Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Salvador Mir, Sylvain Bourdel, Marc Margalef-Rovira, Issa Alaji, Haitham Ghanem, Guillaume Ducournau, Christophe Gaquière:
Special Session on RF/5G Test. ETS 2022: 1-9 - [c33]Gildas Léger, Antonio J. Ginés, Valentin Gutierrez, Manuel J. Barragán:
A methodology for defect detection in analog circuits based on causal feature selection. ICECS 2022 2022: 1-4 - 2021
- [j11]Antonio J. Ginés, Gildas Léger, Eduardo J. Peralías:
Digital Non-Linearity Calibration for ADCs With Redundancy Using a New LUT Approach. IEEE Trans. Circuits Syst. I Regul. Pap. 68(8): 3197-3210 (2021) - 2020
- [j10]Valentin Gutierrez, Gildas Léger:
An adaptive simulation framework for AMS-RF test quality. Integr. 73: 10-17 (2020) - [c32]Antonio J. Ginés, Gildas Léger, Eduardo J. Peralías:
Non-Linear Calibration of Pipeline ADCs using a Histogram-Based Estimation of the Redundant INL. NEWCAS 2020: 142-145 - [c31]Valentin Gutierrez, Gildas Léger:
On the importance of bias-dependent charge injection for SET evaluation in AMS Circuits. NEWCAS 2020: 307-310
2010 – 2019
- 2019
- [c30]Manuel J. Barragán, Gildas Léger, Florent Cilici, Estelle Lauga-Larroze, Sylvain Bourdel, Salvador Mir:
On the use of causal feature selection in the context of machine-learning indirect test. DATE 2019: 276-279 - [c29]Valentin Gutierrez, Gildas Léger:
SET sensitivity evaluation, a comparison before and after layout. DCIS 2019: 1-6 - [c28]Florent Cilici, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel, Gildas Léger:
Yield Recovery of mm-Wave Power Amplifiers using Variable Decoupling Cells and One-Shot Statistical Calibration. ISCAS 2019: 1-5 - [c27]Florent Cilici, Gildas Léger, Manuel J. Barragán, Salvador Mir, Estelle Lauga-Larroze, Sylvain Bourdel:
Efficient generation of data sets for one-shot statistical calibration of RF/mm-wave circuits. SMACD 2019: 17-20 - [c26]Valentin Gutierrez, Gildas Léger:
1 Adaptive defect simulation flow for Defect-oriented Test evaluation. SMACD 2019: 65-68 - [c25]Manuel J. Barragán, Gildas Léger:
Feature selection and feature design for machine learning indirect test: a tutorial review. SMACD 2019: 69-72 - 2018
- [c24]Valentin Gutierrez, Gildas Léger:
Single Event Transient injection in large mixed-signal circuits. DCIS 2018: 1-6 - [c23]Valentin Guiterrez, Antonio J. Ginés, Gildas Léger:
AMS-RF test quality: Assessing defect severity. IOLTS 2018: 23-28 - [c22]Gildas Léger, Manuel J. Barragán:
Mixed-signal test automation: Are we there yet? ISCAS 2018: 1-5 - 2017
- [c21]Manuel J. Barragán, Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Adoración Rueda:
On the limits of machine learning-based test: A calibrated mixed-signal system case study. DATE 2017: 79-84 - 2016
- [j9]Gildas Léger, Carsten Wegener:
Guest Editorial: Analog, Mixed-Signal and RF Testing. J. Electron. Test. 32(4): 405-406 (2016) - [j8]Gildas Léger, Manuel J. Barragán:
Brownian distance correlation-directed search: A fast feature selection technique for alternate test. Integr. 55: 401-414 (2016) - [c20]Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda, Guillaume Renaud, Manuel J. Barragán, Salvador Mir:
Linearity test of high-speed high-performance ADCs using a self-testable on-chip generator. ETS 2016: 1-6 - [c19]Gildas Léger, Manuel J. Barragán:
Questioning the reliability of Monte Carlo simulation for machine learning test validation. ETS 2016: 1-6 - 2015
- [j7]Manuel J. Barragan Asian, Gildas Léger:
A Procedure for Alternate Test Feature Design and Selection. IEEE Des. Test 32(1): 18-25 (2015) - [c18]Manuel J. Barragán, Gildas Léger:
Feature selection for alternate test using wrappers: application to an RF LNA case study. DATE 2015: 1229-1232 - [c17]Gildas Léger:
Combining adaptive alternate test and multi-site. DATE 2015: 1389-1394 - [c16]Gildas Léger:
Boundary cost optimization for Alternate Test. ETS 2015: 1-6 - [c15]Manuel J. Barragán, Gildas Léger, Florence Azaïs, Ronald D. Blanton, Adit D. Singh, Stephen Sunter:
Special session: Hot topics: Statistical test methods. VTS 2015: 1-2 - 2014
- [c14]Antonio J. Ginés, Gildas Léger:
Sigma-delta testability for pipeline A/D converters. DATE 2014: 1-6 - [c13]Gildas Léger:
Doubly-segmented current-steering DAC calibration. DTIS 2014: 1-6 - [c12]Antonio J. Ginés, Eduardo J. Peralías, Gildas Léger, Adoración Rueda:
Closed-loop simulation method for evaluation of static offset in discrete-time comparators. ICECS 2014: 538-541 - 2013
- [c11]Manuel J. Barragan Asian, Gildas Léger:
Efficient selection of signatures for analog/RF alternate test. ETS 2013: 1-6 - [c10]Manuel J. Barragán, Gildas Léger, Diego Vázquez, Adoración Rueda:
Sinusoidal signal generation for mixed-signal BIST using a harmonic-cancellation technique. LASCAS 2013: 1-4 - 2012
- [c9]Manuel J. Barragan Asian, Gildas Léger, José L. Huertas:
OBT for settling error test of sampled-data systems using signal-dependent clocking. ETS 2012: 1-6 - [c8]Manuel J. Barragan Asian, Gildas Léger, José Luis Huertas:
Multi-condition alternate test of analog, mixed-signal, and RF systems. LATW 2012: 1-6 - 2011
- [j6]Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Léger, Adoración Rueda, José L. Huertas:
Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital Envelope Signatures. J. Electron. Test. 27(3): 277-288 (2011) - [c7]Manuel J. Barragan Asian, Rafaella Fiorelli, Gildas Léger, Adoración Rueda, José L. Huertas:
Improving the Accuracy of RF Alternate Test Using Multi-VDD Conditions: Application to Envelope-Based Test of LNAs. Asian Test Symposium 2011: 359-364 - 2010
- [j5]Gildas Léger, Antonio J. Ginés, Eduardo J. Peralías, Adoración Rueda:
On Chopper Effects in Discrete-Time SigmaDelta Modulators. IEEE Trans. Circuits Syst. I Regul. Pap. 57-I(9): 2438-2449 (2010)
2000 – 2009
- 2009
- [j4]Gildas Léger, Adoración Rueda:
Low-Cost Digital Detection of Parametric Faults in Cascaded SigmaDelta Modulators. IEEE Trans. Circuits Syst. I Regul. Pap. 56-I(7): 1326-1338 (2009) - 2006
- [c6]Gildas Léger, Adoración Rueda:
Experimental Validation of a Fully Digital BISTfor Cascaded Sigma Delta Modulators. ETS 2006: 131-136 - 2005
- [j3]Diego Vázquez, Gloria Huertas, África Luque, Manuel J. Barragan Asian, Gildas Léger, Adoración Rueda, José Luis Huertas:
Sine-Wave Signal Characterization Using Square-Wave and SigmaDelta-Modulation: Application to Mixed-Signal BIST. J. Electron. Test. 21(3): 221-232 (2005) - [j2]Alberto Yufera, Adoración Rueda, José Maria Muñoz, Ricardo Doldán, Gildas Léger, Esther Rodríguez-Villegas:
A tissue impedance measurement chip for myocardial ischemia detection. IEEE Trans. Circuits Syst. I Regul. Pap. 52-I(12): 2620-2628 (2005) - 2004
- [j1]Gildas Léger, Eduardo J. Peralías, Adoración Rueda, José Luis Huertas:
Impact of random channel mismatch on the SNR and SFDR of time-interleaved ADCs. IEEE Trans. Circuits Syst. I Regul. Pap. 51-I(1): 140-150 (2004) - [c5]Diego Vázquez, Gildas Léger, Gloria Huertas, Adoración Rueda, José L. Huertas:
A Method for Parameter Extraction of Analog Sine-Wave Signals for Mixed-Signal Built-In-Self-Test Applications. DATE 2004: 298-305 - [c4]Gildas Léger, Adoración Rueda:
A Digital Test for First-Order [Sigma-Delta] Modulators. DATE 2004: 708-709 - 2002
- [c3]Diego Vázquez, Gloria Huertas, Gildas Léger, Adoración Rueda, José L. Huertas:
Practical solutions for the application of the oscillation-based-test in analog integrated circuits. ISCAS (1) 2002: 589-592 - [c2]Diego Vázquez, Gloria Huertas, Adoración Rueda, Gildas Léger, José L. Huertas:
Low-cost on-chip measurements for Oscillation-Based-Test in Analog Integrated Circuits. LATW 2002: 89-93 - [c1]Diego Vázquez, Gloria Huertas, Gildas Léger, Adoración Rueda, José L. Huertas:
Practical Solutions for the Application of the Oscillation-Based-Test: Start-Up and On-Chip Evaluation. VTS 2002: 433-438
Coauthor Index
aka: Manuel J. Barragán
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