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2020 – today
- 2023
[c4]P. C. Chang, P. J. Liao, C. H. Wu, Y. C. Chang, D. H. Hou, Elia Ambrosi, H. Y. Lee, J. H. Lee, X. Y. Bao:
A New Ramp Stress Reliability Assessment on Pulse Energy Based OTS Switching Operation. IRPS 2023: 1-5- 2022
- [c3]P. C. Chang, P. J. Liao, D. W. Heh, C. Lee, D. H. Hou, Elia Ambrosi, C. H. Wu, H. Y. Lee, J. H. Lee, Xinyu Bao:
Investigation of First Fire Effect on VTH Stability and Endurance in GeCTe Selector. IRPS 2022: 4
2010 – 2019
- 2018
- [c2]Z. H. Che
, H. S. Wang, P. C. Huang, P. C. Chang, Y. S. Lee:
Application of Particle Swarm Optimization to Solve Configuration Change Problems. IIAI-AAI 2018: 845-848 - 2016
- [j5]Vijaya Kumar Manupati, P. C. Chang, Manoj Kumar Tiwari:
Intelligent search techniques for network-based manufacturing systems: multi-objective formulation and solutions. Int. J. Comput. Integr. Manuf. 29(8): 850-869 (2016) - 2011
- [j4]Lino Becerra, P. C. Chang, James H. Bishop, David Borsook:
CNS activation maps in awake rats exposed to thermal stimuli to the dorsum of the hindpaw. NeuroImage 54(2): 1355-1366 (2011) - [c1]Jia-Lun Wang, P. C. Chang, Shinn-Yan Lin, Huang-Tien Lin, Chia-Shu Liao:
Remote time and frequency calibration system for telecommunication synchronization applications. APNOMS 2011: 1-6
2000 – 2009
- 2006
- [j3]Y. D. Jhou, C. H. Chen, Shoou-Jinn Chang, Y. K. Su, P. C. Chang, P. C. Chen, H. Hung, C. L. Yu, S. M. Wang, M. H. Wu:
GaN MSM photodetectors with photo-CVD annealed Ni/Au electrodes. Microelectron. J. 37(4): 328-331 (2006) - 2003
- [j2]T. Warren Liao, Evangelos Triantaphyllou, P. C. Chang:
Detection of Welding Flaws With MLP Neural Network and Case Based Reasoning. Intell. Autom. Soft Comput. 9(4): 259-267 (2003) - 2001
- [j1]W. D. Zhuang, P. C. Chang, F. Y. Chou, R. K. Shiue:
Effect of solder creep on the reliability of large area die attachment. Microelectron. Reliab. 41(12): 2011-2021 (2001)
Coauthor Index
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