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Yiping Liang
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2020 – today
- 2024
- [j7]Xu Zhang, Libing Bai, Jie Zhang, Yiping Liang, Yuhua Cheng, Lulu Tian, Yong Duan:
Induced Current Thermo-Electrical Impedance Tomography for Nonferromagnetic Metal Material Surface Defect Profile Reconstruction. IEEE Trans. Ind. Informatics 20(2): 1862-1870 (2024) - [j6]Yiping Liang, Libing Bai, Lulu Tian, Xu Zhang, Chao Ren, Dan Shao, Zhenzhong Ma, Mosi Sun:
Enhanced Diffusion-Based Analysis for Fast Defect Detection in ECPT Image. IEEE Trans. Ind. Informatics 20(2): 2884-2896 (2024) - [j5]Xu Zhang, Libing Bai, Yiping Liang, Jinsheng Yang, Jiangshan Ai, Chao Ren:
Surface Defect 3-D Profile Reconstruction Using Eddy Current Pulsed Thermography. IEEE Trans. Ind. Informatics 20(8): 10092-10102 (2024) - [j4]Xu Zhang, Libing Bai, Lulu Tian, Jiangshan Ai, Yiping Liang, Jie Zhang, Quan Zhou:
Multidirectional Information Fusion for Complex Defect Reconstruction Based on Induced Current Thermo-Electrical Impedance Tomography. IEEE Trans. Ind. Informatics 20(10): 12487-12497 (2024) - [c2]Chenyang Li, Shiji Xiahou, Lulu Tian, Yiping Liang, Min Ma, Cong Chen:
Physical Model Study on Subsurface Defects Detection in Eddy Current Pulsed Thermography. I2MTC 2024: 1-5 - 2023
- [c1]Zhonghua Xiong, Libing Bai, Yiping Liang, Lulu Tian, Cong Chen, Yuhua Cheng:
Total Variation Regularized Sparse Tensor Decomposition for Eddy Current Pulsed Thermography Sequence Processing. I2MTC 2023: 1-5 - 2022
- [j3]Yiping Liang, Libing Bai, Xu Zhang, Chao Ren, Yuhua Cheng:
Potential of Eddy Current Pulsed Thermography as a Nondestructive Testing Method. IEEE Instrum. Meas. Mag. 25(2): 5-15 (2022) - 2021
- [j2]Libing Bai, Yiping Liang, Jin-Liang Shao, Yuhua Cheng, Quan Zhou, Jie Zhang:
Moran's Index-Based Tensor Decomposition for Eddy Current Pulsed Thermography Sequence Processing. IEEE Trans. Instrum. Meas. 70: 1-12 (2021)
2010 – 2019
- 2018
- [j1]Shaodong Zhan, Zhi Li, Jianmin Hu, Yiping Liang, Guanglie Zhang:
Model Order Identification for Cable Force Estimation Using a Markov Chain Monte Carlo-Based Bayesian Approach. Sensors 18(12): 4187 (2018)
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