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Renjian Pan
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2020 – today
- 2024
- [j6]Renjian Pan, Xin Li, Krishnendu Chakrabarty:
Root-Cause Analysis with Semi-Supervised Co-Training for Integrated Systems. ACM Trans. Design Autom. Electr. Syst. 29(3): 51:1-51:22 (2024) - 2023
- [j5]Renjian Pan, Xin Li, Krishnendu Chakrabarty:
Unsupervised Two-Stage Root-Cause Analysis With Transfer Learning for Integrated Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(2): 497-508 (2023) - 2022
- [j4]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Unsupervised Two-Stage Root-Cause Analysis for Integrated Systems. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 41(7): 2170-2184 (2022) - [c5]Renjian Pan, Xin Li, Krishnendu Chakrabarty:
Semi-Supervised Root-Cause Analysis with Co-Training for Integrated Systems. VTS 2022: 1-7 - 2021
- [b1]Renjian Pan:
Applying Machine Learning to Testing and Diagnosis of Integrated Systems. Duke University, Durham, NC, USA, 2021 - [j3]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Cost Reduction Based on Bayesian Network Models. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 40(2): 386-399 (2021) - [c4]Renjian Pan, Xin Li, Krishnendu Chakrabarty:
Unsupervised Root-Cause Analysis with Transfer Learning for Integrated Systems. VTS 2021: 1-6 - 2020
- [j2]Renjian Pan, Jun Tao, Yangfeng Su, Dian Zhou, Xuan Zeng, Xin Li:
Analog/RF Post-silicon Tuning via Bayesian Optimization. ACM Trans. Design Autom. Electr. Syst. 25(1): 7:1-7:17 (2020) - [j1]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-grained Adaptive Testing Based on Quality Prediction. ACM Trans. Design Autom. Electr. Syst. 25(5): 38:1-38:25 (2020) - [c3]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Unsupervised Root-Cause Analysis for Integrated Systems. ITC 2020: 1-10
2010 – 2019
- 2019
- [c2]Renjian Pan, Zhaobo Zhang, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Black-Box Test-Coverage Analysis and Test-Cost Reduction Based on a Bayesian Network Model. VTS 2019: 1-6 - 2018
- [c1]Mengyun Liu, Renjian Pan, Fangming Ye, Xin Li, Krishnendu Chakrabarty, Xinli Gu:
Fine-Grained Adaptive Testing Based on Quality Prediction. ITC 2018: 1-10
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