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2020 – today
- 2023
[c3]Shih-Shin Hu, Kean-Thye Bea, Wei-Hsuan Lin, Da Zheng Lin, Xiu-Zhi Chen, Ting-Ru Lin, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen, Wai-Khuen Cheng:
The Electrical Properties of a-IGZO TFT Prediction Based on Variational Autoencoder Model. ICCE-Taiwan 2023: 723-724- [c2]Khean Thye Bea, Shih-Shin Hu, Wei-Hsuan Lin, Da Zheng Lin, Hsin-Hui Hu, Xiu-Zhi Chen, Ting-Ru Lin, Yen-Lin Chen, Kun-Ming Chen, Wai-Khuen Cheng:
Prediction of Electrical Characteristics of a-IGZO TFT Based on Transfer Learning-Based Variational Autoencoder. SMC 2023: 1230-1234 - 2022
- [c1]Xiu-Zhi Chen, Da Zheng Lin, Shih-Shin Hu, Hsin-Hui Hu, Yen-Lin Chen, Kun-Ming Chen:
Machine Learning-Based Approach to Analyze the Effect of Density of States on the Electrical Properties of a-IGZO TFT. ICCE-TW 2022: 413-414
2010 – 2019
- 2019
- [j6]Venkatesan Nagarajan
, Kun-Ming Chen, Huan-Chung Wang, Sankalp Kumar Singh, Deepak Anandan, Yueh-Chin Lin, Edward Yi Chang:
A simple extraction method for parasitic series resistances in GaN HEMTs considering non-quasi-static effects. Microelectron. J. 87: 51-54 (2019)
2000 – 2009
- 2008
- [j5]Sheng-Yi Huang, Kun-Ming Chen, Guo-Wei Huang, Cheng-Chou Hung, Wen-Shiang Liao, Chun-Yen Chang:
Electrical stress effect on RF power characteristics of SiGe hetero-junction bipolar transistors. Microelectron. Reliab. 48(2): 193-199 (2008) - 2005
- [j4]Ming-Hsiang Cho, Guo-Wei Huang, Chia-Sung Chiu, Kun-Ming Chen, An-Sam Peng, Yu-Min Teng:
A Cascade Open-Short-Thru (COST) De-Embedding Method for Microwave On-Wafer Characterization and Automatic Measurement. IEICE Trans. Electron. 88-C(5): 845-850 (2005) - [j3]Shih-Dao Wu, Guo-Wei Huang, Kun-Ming Chen, Hua-Chou Tseng, Tsun-Lai Hsu, Chun-Yen Chang:
RF MOSFET Characterization by Four-Port Measurement. IEICE Trans. Electron. 88-C(5): 851-856 (2005) - [j2]Han-Yu Chen, Kun-Ming Chen, Guo-Wei Huang, Chun-Yen Chang:
A Novel Approach for Parameter Determination of HBT Small-Signal Equivalent Circuit. IEICE Trans. Electron. 88-C(6): 1133-1141 (2005) - [j1]Han-Yu Chen, Guo-Wei Huang, Kun-Ming Chen, Chun-Yen Chang:
Noise Parameters Computation of Microwave Devices Using Genetic Algorithms. IEICE Trans. Electron. 88-C(7): 1382-1384 (2005)
Coauthor Index
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