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ORCIDArkadiusz Glowacki
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2010 – 2019
- 2014
[j11]Ponky Ivo, Eunjung Melanie Cho, Przemyslaw Kotara, Lars Schellhase, Richard Lossy
, Ute Zeimer, Anna Mogilatenko, Joachim Würfl, Günther Tränkle, Arkadiusz Glowacki, Christian Boit:
New degradation mechanism observed for AlGaN/GaN HEMTs with sub 100 nm scale unpassivated regions around the gate periphery. Microelectron. Reliab. 54(6-7): 1288-1292 (2014)- [j10]Arkadiusz Glowacki, Christian Boit, Philippe Perdu, Yoshitaka Iwaki:
Backside spectroscopic photon emission microscopy using intensified silicon CCD. Microelectron. Reliab. 54(9-10): 2105-2108 (2014) - 2012
- [j9]Carlo Pagano, Christian Boit, Arkadiusz Glowacki, Reiner Leihkauf, Yoshiyuki Yokoyama:
Comparison of FET electro-optical modulation for 1300 nm and 1064 nm laser sources. Microelectron. Reliab. 52(9-10): 2024-2030 (2012) - [j8]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Optimum Si thickness for backside detection of photon emission using Si-CCD. Microelectron. Reliab. 52(9-10): 2031-2034 (2012) - 2011
- [j7]Ponky Ivo, Arkadiusz Glowacki, Eldad Bahat-Treidel, Richard Lossy, Joachim Würfl, Christian Boit, Günther Tränkle:
Comparative study of AlGaN/GaN HEMTs robustness versus buffer design variations by applying Electroluminescence and electrical measurements. Microelectron. Reliab. 51(2): 217-223 (2011) - [j6]Arkadiusz Glowacki, Christian Boit, Philippe Perdu:
Performance improvement of Si-CCD detector based backside reflected light and photon emission microscopy by FIB ultimate substrate thinning. Microelectron. Reliab. 51(9-11): 1632-1636 (2011) - [j5]Sanjib Kumar Brahma, Arkadiusz Glowacki, Reiner Leihkauf, Christian Boit:
Laser induced impact ionization effect in MOSFET during 1064 nm laser stimulation. Microelectron. Reliab. 51(9-11): 1652-1657 (2011)
2000 – 2009
- 2009
- [j4]Arkadiusz Glowacki, Piotr Laskowski, Christian Boit, Ponky Ivo, Eldad Bahat-Treidel, Reza Pazirandeh, Richard Lossy, Joachim Würfl, Günther Tränkle:
Characterization of stress degradation effects and thermal properties of AlGaN/GaN HEMTs with photon emission spectral signatures. Microelectron. Reliab. 49(9-11): 1211-1215 (2009) - 2008
- [j3]Piotr Laskowski, Arkadiusz Glowacki, Christian Boit:
Detectability of dynamic photon emission in static Si CCD for signal path determination in integrated circuits. Microelectron. Reliab. 48(8-9): 1295-1299 (2008) - 2005
- [j2]Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki:
Seebeck Effect Detection on Biased Device without OBIRCH Distortion Using FET Readout. Microelectron. Reliab. 45(9-11): 1487-1492 (2005) - 2004
- [j1]Sanjib Kumar Brahma, Christian Boit, Arkadiusz Glowacki, Hiroyoshi Suzuki:
Localization of FET Device Performance with Thermal Laser Stimulation. Microelectron. Reliab. 44(9-11): 1699-1702 (2004)
Coauthor Index
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