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2010 – 2019
- 2015
[j7]Timothy O. Dickson, Yong Liu, Sergey V. Rylov
, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Michael P. Beakes, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman:
A 1.4 pJ/bit, Power-Scalable 16×12 Gb/s Source-Synchronous I/O With DFE Receiver in 32 nm SOI CMOS Technology. IEEE J. Solid State Circuits 50(8): 1917-1931 (2015)- 2014
- [c4]Timothy O. Dickson, Yong Liu, Sergey V. Rylov, Ankur Agrawal, Seongwon Kim, Ping-Hsuan Hsieh, John F. Bulzacchelli, Mark A. Ferriss, Herschel A. Ainspan, Alexander V. Rylyakov, Benjamin D. Parker, Christian W. Baks, Lei Shan, Young Hoon Kwark, José A. Tierno, Daniel J. Friedman:
A 1.4-pJ/b, power-scalable 16×12-Gb/s source-synchronous I/O with DFE receiver in 32nm SOI CMOS technology. CICC 2014: 1-4 - 2012
- [j6]Miroslav Kotzev, Renato Rimolo-Donadio, Young Hoon Kwark, Christian W. Baks, Xiaoxiong Gu, Christian Schuster:
Electrical Performance of the Recessed Probe Launch Technique for Measurement of Embedded Multilayer Structures. IEEE Trans. Instrum. Meas. 61(12): 3198-3206 (2012)
2000 – 2009
- 2008
- [c3]Renato Rimolo-Donadio, Christian Schuster, Xiaoxiong Gu, Young Hoon Kwark, Mark B. Ritter:
Analysis and Optimization of the Recessed Probe Launch for High Frequency Measurements of PCB Interconnects. DATE 2008: 252-255 - 2006
- [j5]John F. Bulzacchelli, Mounir Meghelli, Sergey V. Rylov, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, Lei Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman:
A 10-Gb/s 5-Tap DFE/4-Tap FFE Transceiver in 90-nm CMOS Technology. IEEE J. Solid State Circuits 41(12): 2885-2900 (2006) - [c2]Mounir Meghelli, Sergey V. Rylov, John F. Bulzacchelli, Woogeun Rhee, Alexander V. Rylyakov, Herschel A. Ainspan, Benjamin D. Parker, Michael P. Beakes, Aichin Chung, Troy J. Beukema, Petar K. Pepeljugoski, L. Shan, Young Hoon Kwark, Sudhir M. Gowda, Daniel J. Friedman:
A 10Gb/s 5-Tap-DFE/4-Tap-FFE Transceiver in 90nm CMOS. ISSCC 2006: 213-222 - 2005
- [j4]John U. Knickerbocker, Paul S. Andry, L. Paivikki Buchwalter, Alina Deutsch, Raymond R. Horton, Keith A. Jenkins, Young Hoon Kwark, Gerald McVicker, Chirag S. Patel, Robert J. Polastre, Christian D. Schuster, Arun Sharma, Sri M. Sri-Jayantha, Christopher W. Surovic, Cornelia K. Tsang, Bucknell C. Webb, Steven L. Wright, Samuel R. McKnight, Edmund J. Sprogis, Bing Dang:
Development of next-generation system-on-package (SOP) technology based on silicon carriers with fine-pitch chip interconnection. IBM J. Res. Dev. 49(4-5): 725-754 (2005) - 2003
- [j3]Daniel J. Friedman, Mounir Meghelli, Benjamin D. Parker, Jungwook Yang, Herschel A. Ainspan, Alexander V. Rylyakov, Young Hoon Kwark, Mark B. Ritter, Lei Shan, Steven J. Zier, Michael Sorna, Mehmet Soyuer:
SiGe BiCMOS integrated circuits for high-speed serial communication links. IBM J. Res. Dev. 47(2-3): 259-282 (2003) - [c1]Seongwon Kim, Mohit Kapur, Mounir Meghelli, Alexander V. Rylyakov, Young Hoon Kwark, Daniel J. Friedman:
45-Gb/s SiGe BiCMOS PRBS generator and PRBS checker [pseudorandom bit sequence]. CICC 2003: 313-316 - 2000
- [j2]Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark:
Wide band home phone line characterization. IEEE Trans. Consumer Electron. 46(1): 76-86 (2000)
1990 – 1999
- 1999
- [j1]Duixian Liu, Ephraim B. Flint, Brian P. Gaucher, Young Hoon Kwark:
Wide band AC power line characterization. IEEE Trans. Consumer Electron. 45(4): 1087-1097 (1999)
Coauthor Index
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