"Test-TSV estimation during 3D-IC partitioning."

Shreepad Panth, Kambiz Samadi, Sung Kyu Lim (2013)

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DOI: 10.1109/3DIC.2013.6702354

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-02

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Shreepad Panth, Kambiz Samadi, Sung Kyu Lim:
Test-TSV estimation during 3D-IC partitioning. 3DIC 2013: 1-7

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