"A 65nm flip-flop array to measure soft error resiliency against ..."

Jun Furuta et al. (2011)

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DOI: 10.1109/ASPDAC.2011.5722306

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-26

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Jun Furuta, Chikara Hamanaka, Kazutoshi Kobayashi, Hidetoshi Onodera:
A 65nm flip-flop array to measure soft error resiliency against high-energy neutron and alpha particles. ASP-DAC 2011: 83-84

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