"On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test."

Hyunjin Kim, Jacob A. Abraham (2011)

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DOI: 10.1109/ATS.2011.31

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Hyunjin Kim, Jacob A. Abraham:
On-Chip Programmable Dual-Capture for Double Data Rate Interface Timing Test. Asian Test Symposium 2011: 15-20

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