"Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: ..."

Shih-Hung Chen (2019)

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DOI: 10.1109/CICC.2019.8780136

access: closed

type: Conference or Workshop Paper

metadata version: 2019-08-07

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Shih-Hung Chen:
Esd Challenges in Advanced Finfet and Gaa Nanowire cmos Technologies: Designing Diode Based ESD Protection in Advanced State of the Art Technologies. CICC 2019: 1-100

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