"Metric Methods in Computer Vision and Pattern Recognition."

Oleh Berezsky, Mykhailo Zarichnyi (2020)

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DOI: 10.1007/978-3-030-63270-0_13

access: closed

type: Conference or Workshop Paper

metadata version: 2022-01-21

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Oleh Berezsky, Mykhailo Zarichnyi:
Metric Methods in Computer Vision and Pattern Recognition. CSIT 2020: 188-209

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