"Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience."

Martin Hoffmann, Christian Dietrich, Daniel Lohmann (2013)

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DOI: —

access: open

type: Conference or Workshop Paper

metadata version: 2023-07-04

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Martin Hoffmann, Christian Dietrich, Daniel Lohmann:
Failure by Design: Influence of the RTOS Interface on Memory Fault Resilience. GI-Jahrestagung 2013: 2562-2576

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