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"Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and ..."
Fei Wu et al. (2018)
- Fei Wu, Yue Zhu, Qin Xiong, Zhonghai Lu, You Zhou, Weizhen Kong, Changsheng Xie:
Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications. ICCD 2018: 381-388
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