"Image Based Metrology for Quantitative Analysis of Local Structural ..."

P. Ravindran et al. (2007)

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DOI: 10.1109/ICIP.2007.4380021

access: closed

type: Conference or Workshop Paper

metadata version: 2022-04-09

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P. Ravindran, Nicola J. Ferrier, S. M. Park, P. F. Nealey:
Image Based Metrology for Quantitative Analysis of Local Structural Similarity of Nanostructures. ICIP (4) 2007: 329-332

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