"Deep Learning-based Production and Test Bug Report Classification using ..."

Misoo Kim, Youngkyoung Kim, Eunseok Lee (2022)

> Home

Details and statistics

DOI: 10.1145/3510454.3528646

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  authority control:
- export record
  dblp key:
  - conf/icse/KimKL22
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/icse/KimKL22
Misoo Kim, Youngkyoung Kim, Eunseok Lee:
Deep Learning-based Production and Test Bug Report Classification using Source Files. ICSE-Companion 2022: 343-344

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.