"Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper ..."

Keno Sato et al. (2021)

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DOI: 10.1109/ITC50571.2021.00038

access: closed

type: Conference or Workshop Paper

metadata version: 2022-03-21

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Keno Sato, Takashi Ishida, Toshiyuki Okamoto, Tamotsu Ichikawa, Jianglin Wei, Takayuki Nakatani, Yujie Zhao, Shogo Katayama, Shuhei Yamamoto, Anna Kuwana, Kazumi Hatayama, Haruo Kobayashi:
Revisit to Accurate ADC Testing with Incoherent Sampling Using Proper Sinusoidal Signal and Sampling Frequencies. ITC 2021: 284-288

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