"Combination of Structural and State Analysis for Partial Scan."

Sameer Sharma, Michael S. Hsiao (2001)

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DOI: 10.1109/ICVD.2001.902652

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Sameer Sharma, Michael S. Hsiao:
Combination of Structural and State Analysis for Partial Scan. VLSI Design 2001: 134-

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