"A patent examining expert system using pattern recognition."

Sang-Sung Park et al. (2011)

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DOI: 10.1016/J.ESWA.2010.09.099

access: closed

type: Journal Article

metadata version: 2017-05-26

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Sang-Sung Park, Won-Gyo Jung, Young-Geun Shin, Dong-Sik Jang:
A patent examining expert system using pattern recognition. Expert Syst. Appl. 38(4): 4302-4311 (2011)

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