"On Fault Testing for Reversible Circuits."

Satoshi Tayu, Shigeru Ito, Shuichi Ueno (2008)

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DOI: 10.1093/IETISY/E91-D.12.2770

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type: Journal Article

metadata version: 2020-04-11

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Satoshi Tayu, Shigeru Ito, Shuichi Ueno:
On Fault Testing for Reversible Circuits. IEICE Trans. Inf. Syst. 91-D(12): 2770-2775 (2008)

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