"Electromigration lifetimes and void growth at low cumulative failure ..."

Hideaki Tsuchiya, Shinji Yokogawa (2006)

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DOI: 10.1016/J.MICROREL.2006.08.001

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type: Journal Article

metadata version: 2020-02-22

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Hideaki Tsuchiya, Shinji Yokogawa:
Electromigration lifetimes and void growth at low cumulative failure probability. Microelectron. Reliab. 46(9-11): 1415-1420 (2006)

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