"BlockHammer: Improving Flash Reliability by Exploiting Process Variation ..."

Ruixiang Ma et al. (2020)

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DOI: 10.1109/TCAD.2020.2981025

access: closed

type: Journal Article

metadata version: 2020-12-01

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  - https://dblp.org/rec/journals/tcad/MaWLZWWX20
Ruixiang Ma, Fei Wu, Zhonghai Lu, Wenmin Zhong, Qiulin Wu, Jiguang Wan, Changsheng Xie:
BlockHammer: Improving Flash Reliability by Exploiting Process Variation Aware Proactive Failure Prediction. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 39(12): 4563-4574 (2020)

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