"Disturbance-Immune and Aging-Robust Internal Short Circuit Diagnostic for ..."

Jian Hu et al. (2022)

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DOI: 10.1109/TIE.2021.3063968

access: closed

type: Journal Article

metadata version: 2021-12-15

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Jian Hu, Hongwen He, Zhongbao Wei, Yang Li:
Disturbance-Immune and Aging-Robust Internal Short Circuit Diagnostic for Lithium-Ion Battery. IEEE Trans. Ind. Electron. 69(2): 1988-1999 (2022)

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