Searching for just a few words should be enough to get started. If you need to make more complex queries, use the tips below to guide you.
Article type: Research Article
Authors: Mingai, Lia; b; * | Shuoda, Guoa | Guoyu, Zuoa; b | Yanjun, Suna | Jinfu, Yanga; b
Affiliations: [a] College of Electronic Information & Control Engineering, Beijing University of Technology, Beijing, China | [b] Beijing Key Laboratory of Computational Intelligence and Intelligent System, Beijing, China
Correspondence: [*] Correspondence to: Li Mingai. Tel.: +86 10 6739 6309; Fax: +86 10 6739 1625; [email protected]
Abstract: Ocular movements are inevitable in electroencephalograme (EEG) collection, and the resulting Ocular Artifact (OA) becomes one of the main interferences of EEG due to its great amplitude. Many methods have been proposed to remove OA from EEG recordings based on Blind Source Separation (BSS) algorithm. Often regression is performed in time or frequency domain by completely deleting the OA components. This can cause the overestimation of OA and the information loss of EEG, because EEG and electrooculogram (EOG) mix or spread bidirectionally. Furthermore, there exists a variety of noises, except for OA, and interference coupling in EEG, this also affects the OA removal performance, such as the robustness and anti-interference ability. Here, we propose a novel and generally applicable method, denoted as FKD, for removing OA from mixed EEG signals with the Fast Kernel Independent Component analysis (FastKICA) and Discrete Wavelet Transform (DWT). In two cases of linear and nonlinear mixed models, many experiments are conducted with Brain Computer Interface (BCI) data set. The experiment results show that FKD has good performance comparing with other BBS-based OA removal methods, and it is more acceptable in actual BCI system.
Keywords: Ocular artifact removal, fast kernel independent component analysis, discrete wavelet transform, overestimation, robustness
DOI: 10.3233/IFS-151564
Journal: Journal of Intelligent & Fuzzy Systems, vol. 28, no. 6, pp. 2851-2861, 2015
IOS Press, Inc.
6751 Tepper Drive
Clifton, VA 20124
USA
Tel: +1 703 830 6300
Fax: +1 703 830 2300
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
IOS Press
Nieuwe Hemweg 6B
1013 BG Amsterdam
The Netherlands
Tel: +31 20 688 3355
Fax: +31 20 687 0091
[email protected]
For editorial issues, permissions, book requests, submissions and proceedings, contact the Amsterdam office [email protected]
Inspirees International (China Office)
Ciyunsi Beili 207(CapitaLand), Bld 1, 7-901
100025, Beijing
China
Free service line: 400 661 8717
Fax: +86 10 8446 7947
[email protected]
For editorial issues, like the status of your submitted paper or proposals, write to [email protected]
如果您在出版方面需要帮助或有任何建, 件至: [email protected]