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Authors: Wolfgang Raschke 1 ; Massimiliano Zilli 1 ; Johannes Loinig 2 ; Reinhold Weiss 1 ; Christian Steger 1 and Christian Kreiner 1

Affiliations: 1 Graz University of Technology, Austria ; 2 NXP Semiconductors Austria GmbH, Austria

Keyword(s): Software Reusability, Test-Driven Development.

Related Ontology Subjects/Areas/Topics: Embedded Communications Systems ; Software Architectures ; Telecommunications

Abstract: Platform-based development is one of the most successful paradigms in software engineering. In embedded systems, the reuse of software on several processor families is often abandoned due to the multitude of compilers, processor architectures and instruction sets. In practice, we experienced that a lack of hardware abstraction leads to non-reusable test cases. We will demonstrate a re-engineering process that follows test-driven development practices which fits perfectly for migration activities. Moreover, we will introduce a process that provides trust for the test cases on a new hardware.

CC BY-NC-ND 4.0

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Paper citation in several formats:
Raschke, W.; Zilli, M.; Loinig, J.; Weiss, R.; Steger, C. and Kreiner, C. (2015). Test-Driven Migration Towards a Hardware-Abstracted Platform. In Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS; ISBN 978-989-758-084-0; ISSN 2184-2817, SciTePress, pages 261-267. DOI: 10.5220/0005216302610267

@conference{peccs15,
author={Wolfgang Raschke. and Massimiliano Zilli. and Johannes Loinig. and Reinhold Weiss. and Christian Steger. and Christian Kreiner.},
title={Test-Driven Migration Towards a Hardware-Abstracted Platform},
booktitle={Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS},
year={2015},
pages={261-267},
publisher={SciTePress},
organization={INSTICC},
doi={10.5220/0005216302610267},
isbn={978-989-758-084-0},
issn={2184-2817},
}

TY - CONF

JO - Proceedings of the 5th International Conference on Pervasive and Embedded Computing and Communication Systems - PECCS
TI - Test-Driven Migration Towards a Hardware-Abstracted Platform
SN - 978-989-758-084-0
IS - 2184-2817
AU - Raschke, W.
AU - Zilli, M.
AU - Loinig, J.
AU - Weiss, R.
AU - Steger, C.
AU - Kreiner, C.
PY - 2015
SP - 261
EP - 267
DO - 10.5220/0005216302610267
PB - SciTePress

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