A Diagnosis Algorithm for Constant Degree. Structures and Its Application to VLSI Circuit Testing. Kaiyuan Huang, Vinod K. Agarwal, Fellow, IEEE, Laurence ...
A simple diagnosis algorithm is presented for constant degree systems such as rectangular grids connected as tori. The algorithm determines the status of a ...
A simple diagnosis algorithm is presented for constant degree systems such as rectangular grids connected as tori. The algorithm determines the status of a ...
Thulasiraman, “A Diagnosis Algorithm for Constant Degree Structures and Application to VLSI Circuit Testing”, IEEE Trans. on Parallel and Distributed ...
The problem of fault diagnosis in grid-connected systems is considered. A diagnosis algorithm, called DAGS and based on the PMC model, is presented.
The book's focus on VLSI test principles and DFT architectures, while deemphasizing test algorithms, is an ideal choice for undergraduate education. In ...
Logic Simulation is performed to a. Predicts the behaviour of faulty circuits b. Find out the location of faults in faulty circuits.
Abstract: This chapter describes different approaches to test generation, fault simulation and fault diagnosis in digital circuits and systems. First, an ...
(PDF) Wafer-Scale VLSI Testing | Stefano Chessa - Academia.edu
www.academia.edu › Wafer-Scale_VLSI...
[5] K. Huang, V.K. Agarwal, L. LaForge, and K. Thulasiraman, “A Diagnosis Algorithm for Constant Degree Structures and Its Application to VLSI Circuit Testing” ...
One of the many application areas that has made effective use of algorithm design and analysis is computer-aided design (CAD) of digital circuits.