Abstract: The impact of device variability, temperature, and technology CAD-based layout parasitics on low-voltage static random access memory (SRAM) yield ...
Apr 13, 2016 · The impact of device variability, temperature, and technology CAD-based layout parasitics on low-voltage static random access memory (SRAM) ...
The impact of device variability, temperature, and technology CAD-based layout parasitics on low-voltage static random access memory (SRAM) yield is ...
A Universal Hardware-Driven PVT and Layout-Aware Predictive ...
dl.acm.org › doi › TVLSI.2015.2427196
The yield analysis results are corroborated with hardware yield using 4–16-Mb inline SRAM macro monitors. The methodology is unique in the industry, gives ...
Abstract—The impact of device variability, temperature, and technology CAD-based layout parasitics on low-voltage static random access memory (SRAM) yield ...
A Universal Hardware-Driven PVT and Layout-Aware Predictive Failure Analytics for SRAM. 机译：适用于SRAM的通用硬件驱动的PVT和布局感知的预测性故障分析. 展开 ...
A universal hardware-driven PVT and layout-aware predictive failure analytics for SRAM. Rajiv V. Joshi; Sudesh Saroop; et al. 2016; IEEE Transactions on VLSI ...
A Universal Hardware-Driven PVT and Layout-Aware Predictive Failure Analytics for SRAM · Author Picture Rajiv Joshi. , IBM Thomas J. Watson Labs, Yorktown ...
Carl Radens's 7 research works with 396 citations, including: A Universal Hardware-Driven PVT and Layout-Aware Predictive Failure Analytics for SRAM.
Karthik Yogendra: A Universal Hardware-Driven PVT and Layout-Aware Predictive Failure Analytics for SRAM. IEEE Trans. Very Large Scale Integr. Syst. 24(3) ...