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We present a methodology, based on genetic algorithms, that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak ...
We present a methodology, based on genetic algorithms, that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak ...
We present a methodology, based on genetic algorithms, that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak power ...
A methodology, based on genetic algorithms, is presented that optimizes shared heterogeneous Memory BIST architectures with regards to area, testing peak ...
Lilia Zaourar, Jihane Alami Chentoufi, Yann Kieffer, Arnaud Wenzel, Frederic Grandvaux: A shared BIST optimization methodology for memory test.
More and more complex functionalities are currently implemented inside SoC which leads to embed hundreds of memories having different sizes and properties.
Testing all the memories in these SoCs sequentially would take a long time. Therefore, a memory. BIST design that allows two or more memories to be tested.
In this paper, a new memory BIST methodology is proposed which optimizes area overhead, test power and test time. It exploits Genetic Algorithms to find a set ...
In this method a data processor has a single test controller. The test controller has a test pattern generator and a memory verification element. The test ...
Tessent MemoryBIST provides an automated approach called shared bus learning to map the physical memory composition of each logical memory.