In order to cope with tomorrow's challenges in the microelectronic market, the reliability of the first phases of the design process must be improved.
This tool operates as a Testability Analyzer able to identify critical areas for testability in designs whose functional modules and local interconnections are ...
Abstract-In order to cope with tomorrow's challenges in the microelectronic market, the reliability of the first phases of the design process must be ...
This paper describes the different abstraction levels at which testabilit y analysis will be applied in the REQUEST Project, and presents an application ...
在本文中，我们介绍了一种在系统设计层面应用功能可测试性的新方法，并证明了它在工业环境中应用的可能性。涉及规则拓扑和不规则拓扑的可测试性条件已经被定义、形式化并 ...
The paper will propose a new approach to the problem of the design of testable structures: a hierarchical testability analyzer determines testability of the ...
ALADIN: a multilevel testability analyzer for VLSI system design. M Bombana, G Buonanno, P Cavalloro, F Ferrandi, D Sciuto, G Zaza. IEEE Transactions on Very ...
ALADIN: a multilevel testability analyzer for VLSI system design. Citing Article. June 1994. IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
Apr 25, 2024 · ALADIN: a multilevel testability analyzer for VLSI system design. IEEE Trans. Very Large Scale Integr. Syst. 2(2): 157-171 (1994). [c5]. view.
TIES: A testability increase expert system for VLSI design - SpringerLink
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Aug 15, 1994 · TIES is a knowledge based system that advises the ICs designer on the best modifications to perform on a circuit with testability problems, ...