Abstract: In this work we present a SPICE-based RTL subthreshold-leakage model analyzing components built in 70nm technology [1].

Analysis and Modeling of Subthreshold Leakage of. RT-Components under PTV and State Variation. Domenik Helms', Gunter Ehmen', and Wolfgang Nebel2. 1OFFIS ...

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Analysis and Modeling of Subthreshold Leakage of RT-Components under PTV and State Variation ; Narendra S.G. · 2005 , citations by CoLab: 31 | Abstract ; Borkar S.

Analysis and Modeling of Subthreshold Leakage of RT-Components under PTV and State Variation. Export. BIB. Alle Autoren. Helms, Domenik and Ehmen, ...

We present a blackbox approach to model leakage currents of RTL data-path components. The model inputs are temperature, V DD , body voltage of NMOS and PMOS ...

Analysis and modeling of subthreshold leakage of RT-components under PTV and state variation. D Helms, G Ehmen, W Nebel. Proceedings of the 2006 international ...

D. Helms, Analysis and modeling of subthreshold leakage of RT-components under PTV and state variation, Proceedings of the 2006 international symposium on Low ...

[HEN06] D. Helms, G. Ehmen, W. Nebel: Analysis and Modeling of Subthreshold Leakage of RT-Components under PTV and State Variation, ISLPED 2006. [HNN06] D.

Analysis and modeling of subthreshold leakage of RT components under PTV and state variation. In Intl. Symposium on Low Power. Electronics and Design, pages ...