In this paper, we aim to address this issue for SRAM PUFs with novel bit analysis and bit selection algorithms.

We develop a bit selection procedure around these observations that produces very stable bits for the PUF generated ID/key. Experimental data from real SRAM ...

The analysis of real SRAM PUFs reveals critical conditions on which to select stable SRAM cells for PUF at low-cost and develops a bit selection procedure ...

Dec 23, 2021 · (2014) Bit selection algorithm suitable for high-volume produc- tion of SRAM-PUF. Proc. IEEE international symposium on hardware-oriented ...

In this work, the reduction in ECC complexity through a bit selection method based on the Data Retention Voltage metric is demonstrated.

Oct 22, 2024 · When an SRAM is read out, these power-up states provide a unique output that is largely consistent during repeated power-up cycles for a given ...

Jun 1, 2022 · ... Bit selection algorithm suitable for high-volume production of SRAM-PUF. Proc. IEEE international symposium on hardware-oriented security ...

Huang, M.Tehranipoor, “Bit Selection Algorithm Suitable for High-Volume Production of SRAM-PUF,” in Hardware-Oriented Security and Trust (HOST), May 2014.

Since reliable cells have a higher DRV value than unreliable ones, the MTSV method can predict which cells remain reliable under a variety of environmental ...

Oct 14, 2024 · Bit selection algorithm suitable for high-volume production of SRAM-PUF. In 2014 IEEE International Symposium on Hardware-oriented Security ...