In this paper, we propose an efficient test flow for Cell-Aware Test (CAT) to drastically reduce the time for CAT-enhanced test generation at the cell level ...
In this paper, we propose an efficient test flow for Cell-Aware Test (CAT) to drastically reduce the time for CAT-enhanced test generation at the cell level ...
An efficient test flow for Cell-Aware Test (CAT) is proposed to drastically reduce the time for CAT-enhanced test generation at the cell level by exploiting ...
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What is cell aware ATPG?
How does ATPG work?
The new cell-aware test (CAT) approach, which enables a transistor-level and defect-based ATPG on full CMOS-based designs to significantly reduce the defect ...
The algorithm is capable of generating multiple-pattern tests that detect switch stuck-open and stuck-closed faults. Test validity is maintained under hazard ...
Based on the analog simulation results, a cell-aware fault model is created that directs ATPG to generate patterns targeting these internal cell defects. There ...
These works focus on either proposing new algorithms to optimize cell-aware ATPG performances as in [13], [15], exploiting switch-level ATPGs to generate test.
May 31, 2022 · Wu, and H. H. Chen, "Cell-aware test generation time reduction by using switch-level ATPG," in Proc. of Int'l Test Conf. in Asia (ITC-Asia) ...
Mar 10, 2023 · set of cell patterns for the ATPG process with the aim to reduce the ATPG compute time. Page 36. 1.5 Thesis Contributions. 15. To solve Problem ...
This paper describes the new cell-aware test (CAT) approach, which enables a transistor-level and defect-based ATPG on full CMOS-based designs to significantly ...